Scanning Electron Microscope
The JEOL JSM-IT500HR scanning electron microscope has a high-brightness electron gun system, providing high-resolution imaging with high sensitivity and spatial resolution. The variable pressure system allows for the analysis of weak conducting/easily eroded samples under low-vacuum settings. The instrument is fitted with a Thermo Fisher UltraDry EDS detector and a Thermo Fisher MagnaRay WDS detector. This allows for secondary/backscatter imaging and EDS/WDS elemental analysis/mapping. The variable pressure settings allow for the analysis of a variety of samples from conductive metals to biological samples with no pre-treatment with a resolution of up to 4nm.
The SEM lab contains a Leo 1450 variable pressure electron microscope acquired in 2003 with a NSF grant that supports several departments here at SMU. The instrument has both low and high vacuum secondary electron detectors as well as a solid state backscatter electron detector. It is also equipped with an Edax energy dispersive X-ray analysis system for determining elemental composition of sample materials. A Gatan Chroma CL cathodoluminescent system was added recently to image samples emitting multiple wavelengths of light under electron beam bombardment. The laboratory is also equipped with sample preparation facilities that include a Denton Vacuum DCP-1 Critical Point Dryer and a Desk II Plasma Coater with Au/Pd target.
SMU Scanning Electron Microscope Laboratory
Roy M. Huffington Department of Earth Sciences
PO Box 750395 | Dallas, Texas | 75275-0395
214-768-6542 | ndmello@smu.edu